Guest Editors' Introduction: Yield Learning Processes and Methods

نویسندگان

  • Anne E. Gattiker
  • Phil Nigh
چکیده

h MAXIMIZING PRODUCT YIELDS is the primary opportunity to improve profit margins for products during high-volume production. Even more important, quickly ramping yields is tcritical to meeting time-to-market (and ‘‘time-to-money’’) requirements. In several high-profile cases yield issues have materially altered product roadmaps for key sub-40 nm products across the industry, affecting both foundries and chip-makers. Clearly, every semiconductor company focuses on maximizing yield as a key business metric. While yield-learning has always been a critical capability, processes and methods for accomplishing it are changing because of both business and technical trends.

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عنوان ژورنال:
  • IEEE Design & Test of Computers

دوره 29  شماره 

صفحات  -

تاریخ انتشار 2012